Ocean Star Inspection Service offers advanced X-ray Fluorescence (XRF) and Optical Emission Spectroscopy (OES) analytical services to meet your material analysis needs at onsite and client facilities.

X-ray Fluorescence (XRF) Analysis:

XRF analysis is a non-destructive technique used to determine the elemental composition of materials. Our XRF services provide rapid and accurate identification and quantification of elements present in solids, liquids, powders, and thin films. Whether you need elemental analysis for quality control, material characterization, or regulatory compliance, our XRF experts deliver actionable insights with unmatched efficiency and precision. .

Optical Emission Spectroscopy (OES) Analysis:

OES analysis is a technique used to determine the elemental composition of metals through the analysis of their optical emission spectra. Our OES services provide fast and accurate elemental analysis of metals, alloys, and metallic coatings, enabling quality control, material verification, and alloy identification with confidence. .